The Long term Aging of Autonomous STructures (LAAST) seminar series focuses on reliability and aging of devices for energy conversion, information processing or sensing.
In this talk, I will discuss some of the major sources of performance degradation for common glass-encapsulated PV modules, including crystalline silicon and thin films. The greatest reliability challenges have occurred in the latter, with recent studies showing that thin-film modules operating in damp heat at -600 V are vulnerable to large amounts of degradation, potentially exceeding half the original power output.
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