[Audio] Birck Nanomaterials Characterization Workshop: Recent Episodes
Neil R Dilley
The aim of the workshop is to review the measurement techniques for both newcomers and existing users, see the instruments in action, and discuss cutting edge developments in both instrumentation and research.
Nanolithography with Nanofrazor: thermal Scanning Probe Microscopy, Direct write laser lithography: ML3 series, and Software and Hardware add ons for EBL: NeoMicra
Correlative Microscopy with the AFSEM: (AFM in SEM), Single Photon Detectors and Counting Electronics (SNSPD), Educational Tools for Quantum Optics (qutools), and Cyrogenic Magneto Optical Platform (OptiCool)
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 2.
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 1.
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 3.